The tests for the SIMD floating-point maximum and minimum operations
require particular care because the handling of the NaN values is
non-deterministic and may vary between platforms. There is no way to
match several NaN values in a test, so the solution is to extract the
non-deterministic test cases into a separate file that is subsequently
replicated for every backend under test, with adjustments made to the
expected results.
Copyright (c) 2021, Arm Limited.
With this change we now reuse tests across multiple arches.
Duplicate tests were merged into the same file where possible.
Some legacy x86 tests were left in separate files due to incompatibilities with the rest of the test suite.
